Trends in Electronic Measurement

Mr. Jay Alexander
CTO Keysight Technologies, Santa Rosa, CA

Cerent Engineering Science Complex, Salazar Hall 2009A
4:00 PM

Abstract - Electronic measurement is critical for the advancement of the electrical engineering profession, and more broadly for addressing many of the challenges and opportunities facing the world today. Modern electronic measurement instruments are both beneficiaries and enablers of new technology, and as such their architectures and capabilities can provide insight on the patterns of hardware and software technology adoption occurring across the electronics landscape. This talk will cover some of the most important trends at work in electronic measurement, including the ongoing evolution from analog to digital architectures, the dramatically increased role of software, and the emergence of sophisticated multifunction instruments. These trends will be highlighted with examples drawn from three foundational electronic measurement instruments: the oscilloscope, the spectrum analyzer, and the network analyzer.

Mr. Jay Alexander is Senior Vice President and Chief Technology Officer of Keysight Technologies. He leads Keysight's central technology strategy and development, focusing on market trends and top opportunities for the company to achieve competitive advantage and growth. Prior to Keysight, Mr. Alexander held numerous leadership positions at Agilent Technologies, including serving as VP and GM for the Oscilloscope and Protocol Division. He began his career at Hewlett-Packard as a Manufacturing and Test Engineer after working on robotics at IBM as a co-op student. Mr. Alexander earned a B.S. in Electrical Engineering from Northwestern University and an M.S. in Computer Science from the University of Colorado, where his thesis work focused on connectionist (neural network) rule extraction. He is a licensed Professional Engineer and a Senior Member of the IEEE. He serves on the Visiting Committee on Advanced Technology at NIST and holds 24 U.S. patents.