Abstract - What is measurement uncertainty? What are the major contributors to electronic measurement uncertainties? Why shall we care? From laser tape measures, home electronic blood pressure monitors to weather satellites, electronic measurements are employed in various capacities. Measurement uncertainty is the key parameter that defines the capability of all these measurement apparatus. Through continuous research efforts in measurement science and technology to reduce measurement uncertainties, we get a more confident assessment of our own health, our environment, and our safety. This presentation will cover the basics of measurement uncertainty, some of the latest developments in measurement uncertainty reduction and future impacts.

Mr. Ken Wong has been with HP/Agilent for over 40 years. His experience at HP/Agilent includes product design, manufacturing process and metrology development. He is currently responsible for the development, modeling and measurement of microwave reference standards and calibration methods. He collaborates regularly with NIST (National Institute of Science and Technology) and other national metrology institutes on VNA (vector network analyzer) calibration standards modeling, uncertainties, and verification. He has published and presented many papers on VNA calibration and standards. He was granted over a dozen patents.